Dielectric Temperature Spectrum Measurement System
I. Performance Features:
Test frequency: 20Hz to 2MHz, 10mHz step
Test level: 10mV to 5V, 1mV step
Basic accuracy: 0.1%
Measurement speed up to 200 times/s
320×240 dot matrix large graphic LCD display
Five-digit reading resolution
Can measure 22 impedance parameter combinations
Four signal source output impedances
10-point list scan test function
Built-in DC bias source
External bias current source up to 40A (configure two TH1776) (optional)
Automatic Level Control (ALC) function for voltage or current
V, I test signal level monitoring function
Graphical scan analysis function
20 groups of internal instrument settings for storage/recall
Built-in comparator, 10-bin sorting and counting function
Multiple communication interfaces for convenient user connection
2m/4m test cable extension (optional)
Chinese/English selectable operation interface
Can automatically upgrade instrument working program via USB HOST
II. Main Applications:
Passive components: Impedance parameter evaluation and performance analysis of capacitors, inductors, magnetic cores, resistors, piezoelectric devices, transformers, chip components and network components.
Semiconductor components: C-VDC characteristics of varactor diodes; parasitic parameter analysis of transistors or integrated circuits
Other components: Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
Dielectric materials: Evaluation of dielectric constant and loss angle of plastics, ceramics and other materials
Magnetic materials: Evaluation of permeability and loss angle of ferrite, amorphous and other magnetic materials
Semiconductor materials: Dielectric constant, conductivity and C-V characteristics of semiconductor materials
Semiconductor materials: Dielectric constant, conductivity and C-V characteristics of semiconductor materials
