1. After connecting the instrument's power cord, turn on the power switch, connect the appropriate test fixture, and warm up for 10 minutes.
2. Use the "Brightness" adjustment knob to set the brightness of the trace on the instrument's display to an appropriate level, but not too bright to avoid damaging the oscilloscope tube; use the "Focus" and "Auxiliary Focus" knobs to make the trace as fine and clear as possible to improve reading accuracy; use the vertical and horizontal position knobs to move the trace to the center of the lowest horizontal line on the screen, coinciding with the bottom line, to facilitate reading during testing.
3. According to the test conditions required for the transistor under test, set the relevant test conditions using the knobs and buttons on the instrument panel.
4. Insert the transistor under test into the port on the test fixture with the correct polarity; the instrument will display a graph similar to the one below:
5. Read the amplification factor test value.
Because the transistor's amplification factor β = IC/IB, you must read the IC and IB values to calculate the amplification factor. The "Current/Division" knob on the instrument panel sets the value per division for IC, and the "Current-Voltage/Step" knob sets the value per step for IB. The IC value is read by the number of vertical divisions occupied by the graph, while the IB value is read by the number of steps in the waveform. Assuming the test waveform in the above figure as an example: the "Current/Division" knob is set to 10mA, and the "Current-Voltage/Step" knob is set to 1mA. From the waveform in the figure, it can be seen that the waveform occupies 3.4 vertical divisions and has 2 steps. Therefore, the amplification factor is calculated as follows:
β = IC/IB = (10mA × 3.4 divisions) ÷ (1mA × 2 steps) = 34mA ÷ 2mA = 17
6. If further testing is needed, repeat steps 4-5. After testing is complete, turn off the instrument power. [4]
1. When inserting the transistor under test into the test port, always ensure correct polarity to avoid damaging the component's performance.
2. When conducting MOS tube voltage withstand tests, high voltage is output at the test port. Do not touch the test port or the pins of the component under test with any part of the body to prevent electric shock.
3. Keep the instrument and test fixtures clean at all times to reduce or eliminate test errors caused by excessive dust in the test ports.
4. Report promptly when the instrument has significant test errors or other malfunctions.
