1. After connecting the power cord of the instrument, turn on the power switch, connect the relevant test fixture, and warm up for 10 minutes.
2. Adjust the brightness of the light beam on the instrument display to an appropriate level using the "Intensity" knob, but do not make it too bright to avoid damaging the oscilloscope tube; adjust the beam to be as fine and clear as possible using the "Focus" and "Auxiliary Focus" knobs to improve reading accuracy; move the beam to the middle of the bottom horizontal line on the screen using the vertical and horizontal position knobs, and make it coincide with the bottom line for convenient reading during testing.
3. According to the test conditions required for the transistor under test, set the relevant test conditions using the knobs and buttons on the instrument panel.
4. Insert the transistor under test into the port on the test fixture with the correct polarity. At this time, the instrument displays a graph similar to the one below:
5. Read the amplification factor test value.
Because the amplification factor of a transistor is β=IC/IB, it is necessary to read the IC and IB values before calculating the amplification factor. The "Current/Div" knob on the instrument panel sets the value of IC per division, and the "Current-Voltage/Step" knob sets the value of IB per step. The IC value is read by looking at the number of vertical divisions occupied by the waveform, while the IB value is read by looking at the number of steps of the waveform. Assuming the test waveform in the above figure as an example: the "Current/Div" knob is set to 10mA, and the "Current-Voltage/Step" knob is set to 1mA. From the waveform in the figure, it can be seen that the waveform occupies 3.4 vertical divisions and has 2 steps. Therefore, the amplification factor is calculated as follows:
β=IC/IB=(10mA×3.4 divisions)÷(1mA×2 steps)=34mA÷2mA=17
6. If further testing is required, repeat steps 4-5. After testing is completed, turn off the instrument power.
1. When inserting the transistor under test into the test port, be sure to match the polarity to avoid damaging the component's performance.
2. When performing MOS tube withstand voltage tests, high voltage is output at the test port. Do not touch the test port or the pins of the component under test with any part of the human body to prevent electric shock.
3. Keep the instrument and test fixture clean at all times to reduce or eliminate test errors caused by excessive dust in the test port.
4. Report promptly when the instrument has large test errors or other malfunctions.
The transistor characteristic curve tracer can be used to measure the common collector, common base, and common emitter input characteristics, output characteristics, transfer characteristics, α, and β parameter characteristics of transistors; it can measure various reverse saturation currents ICBO, ICEO, IEBO, and various breakdown voltages BUCEO, BUCEO, BUEBO, etc.; it can also measure diodes, transistors, and other semiconductor devices.
